The NXP Semiconductors SA56004X is an SMBus compatible, 11-bit remote/local digital
temperature sensor with overtemperature alarms. The remote channel of the SA56004X
monitors a diode junction, such as a substrate PNP of a microprocessor or a diode
connected transistor such as the 2N3904 (NPN) or 2N3906 (PNP). With factory trimming,
remote sensor accuracy of 1 C is achieved.
Undertemperature and overtemperature alert thresholds can be programmed to cause the
ALERT output to indicate when the on-chip or remote temperature is out of range. This
output may be used as a system interrupt or SMBus alert. The T_CRIT output is activated
when the on-chip or remote temperature measurement rises above the programmed
T_CRIT threshold register value. This output may be used to activate a cooling fan, send
a warning or trigger a system shutdown. To enhance system reliability further, the
SA56004X employs an SMBus time-out protocol. The SA56004X has a unique device
architecture.
The SA56004X is available in the SO8, TSSOP8 and HVSON8 packages. SA56004X has
8 factory-programmed device address options. The SA56004X is pin-compatible with the
LM86, MAX6657/8, and ADM1032.
Features and benefits
Accurately senses temperature of remote microprocessor thermal diodes or diode
connected transistors within 1 C
On-chip local temperature sensing within 2 C
Temperature range of 40 C to +125 C
11-bit, 0.125 C resolution
8 different device addresses are available for server applications. The SA56004ED
with marking code 56004E, and SA56004EDP with marking code 6004E are address
compatible with the National LM86, the MAX6657/8 and the ADM1032.
Offset registers available for adjusting the remote temperature accuracy
Programmable under/overtemperature alarms: ALERT and T_CRIT
SMBus 2.0 compatible interface, supports TIMEOUT
Operating voltage range: 3.0 V to 3.6 V
I
2C-bus Standard-mode and Fast-mode compatible
SO8, TSSOP8 and HVSON8 packages
Programmable conversion rate (0.0625 Hz to 26 Hz)
Undervoltage lockout prevents erroneous temperature readings
Latch-up testing is done to JEDEC Standard JESD78 which exceeds 100 mA
